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Maker-Ray

AOI

43X-HW

Features

  • Height Section Positioning ,high level of information visualization
  • Multi-directional sensor,multi-view corresponding point phase consistency
  • Dynamic adaptive datum ensures measurement accuracy
  • AI intelligent programming simplifies complexity and is more efficient
Maker-Ray 43X-HW

Description

  • Intelligently remove noise with depth map. Solve distortion problem in 3Dimaging.
  • Measurement height can be configured, meeting a variety of inspectionrequirements
  • Dynamic self-adoption reference plane algorithm to calibrate substrate height
  • Multi-frequency four-step phase algorithm to strengthen robustness, avoidinginfluence ofillumination changing imaging

Specifications

AIS-43X HW
Specification Details

Find Out More on the manufacturer's website

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